NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY USA Tender

Notice Of Intent To Noncompetitively Acquire An Inverse Gas Chromatography Instrument For 2d Films And Particulates. this Notice Is Not A Request For A Quotation. A Solicitation Document Will Not Be Issued, And Quotations Will Not Be Requested. this Acquisition Is Being Conducted Under The Authority Of Far 13.106-1(b). The North American Industry Classification System (naics) Code For This Acquisition Is 334516– Analytical Laboratory Instrument Manufacturing A Small Business Size Standard Of 1,000 Employees. the National Institute Of Standards And Technology (nist) Infrastructure And Materials Group Within The Engineering Laboratory In Gaithersburg, Maryland Is Seeking An Inverse Gas Chromatography Instrument To Study Work Of Adhesion Through Dispersive And Specific Surface Energy Measurements Of Advanced Packaging Components. These Parameters Will Be Studied Under Variable Temperature And Relative Humidity Throughout The Aging Process To Study Long-term Reliability Of Materials Used In Advanced Packaging Of Semiconductor Chips. This Work Is In Support Of The Chips Metrology Program (grand Challenge 3: Enabling Metrology For Integrating Components In Advanced Packaging). the Chips Metrology Program Develops And Advances Cutting Edge Metrology Capabilities For Members Of The Us Semiconductor Manufacturing Ecosystem. This Nist Conducted Research Program Works With Device Manufacturers, Tool Vendors, Materials Suppliers, And Other Organizations To Address Critical Metrology Gaps To Spur Innovation Within Seven Grand Challenge Areas. For More Information On Chips Metrology, Please Visit Https://www.nist.gov/chips/research-development-programs/metrology-program. in Support Of The Chips Metrology Program, Reliability Testing And Modeling Of Polymeric Components In Advanced Packaging For Semiconductors Will Be Studied And Developed. These Materials Will Include Underfill Epoxies, Thermal Interface Materials, And Redistribution Layer Components. Extensive Material Property Characterization Of These Components And Their Interfacial Properties During Environmental Exposure (e.g., Temperature, Humidity, Thermal Cycling) Will Be Completed For Accurate Reliability Modeling Development. Inverse Gas Chromatography Will Be Used To Measure Shifts In Work Of Adhesion Throughout The Aging Process As Part Of This Work. The Work Of Adhesion Of Films (and Particulates As Needed) Will Be Measured On Samples Throughout The Aging Process. These Properties Will Also Be Measured In Samples Under Variable Temperature And Relative Humidity To Investigate The Effects Of These Environmental Factors On Work Of Adhesion Throughout The Aging Process. the Contractor Shall Provide Inverse Gas Chromatography System That Meets All Technical Specifications And Performance Specifications Identified Below: flame Ionization Detector For Organic Solvent Analysis thermal Conductivity Detector Or Comparable Detector For Competitive Binding Analysis Of Inorganic Gas Molecules Including Oxygen And Carbon Dioxide probe Vapor Injection System instrument Must Be Calibrated For A Standard Series Of Gas Analyte Probes Along With Several Polar Probes. injection Type Options Should Allow For Both Targeted Surface Coverage As Well As Target Moles Injected. the Instrument Should Be Capable Of Conducting Measurements With Controlled Levels Of Surface Coverage Of The Analyte Probe. The Instrument Should Also Be Able To Provide User-specified Variable Coverage To Measure The Effect Of Surface Heterogeneity On Surface Energy And Other Related Material Properties. column Oven temperature Up To At Least 150 °c accommodates Columns Of Varying Inner Diameter (2-10 Mm Inner Diameter). includes Column Holder 2d Film Cell Holder accommodates Thin Films Ranging In Thickness From 102 Nm (supported On A Substrate) To 10 Mm data Station control And Analysis Software pulse Analysis isotherm Analysis dead-time Correction surface Energy Analysis To Include Both Dispersive And Specific Energy Components surface Heterogeneity Mapping To Include Both Heterogeneity Profiling And Distribution acid-base Free Energy Of Desorption Analysis calculation Of Enthalpy Of Specific Free Energy work Of Adhesion Calculation cross-linking Analysis method Data Storage And Display (including Solvents Used) humidity Control (0 % Up To At Least 80 % Relative Humidity) nist Conducted Market Research In November 2024 To January 2025 To Determine What Sources Could Potentially Meet Nist’s Minimum Requirements. This Included Searches On Gsa; Sam; Thomas Register; Surveying Vendor Websites; Speaking With Subject Matter Experts Inside And Outside Of Nist; And Issuance Of A Sources Sought Notice On Sam.gov. Market Research Identified A Few Manufacturers That Produce Gas Chromatography Systems, But Only One With The Ability To Measure Solid Samples. The Results Of Market Research Revealed That Only Surface Measurement Systems Ltd North Amercia (uei: Yt1ngjbght23) Appears To Be Capable Of Meeting Nist’s Requirements. however, Any Sources That Believe They Are Capable Of Meeting Nist’s Minimum Requirements Are Encouraged To Respond To This Notice By The Response Date To Provide The Following Information At A Minimum: Company Unique Entity Identifier (uei) Number In Https://sam.gov; Details About What Your Company Is Capable Of Providing That Meets Or Exceeds Nist’s Minimum Requirements; Whether Your Company Is An Authorized Reseller Of The Product Or Service Being Cited And Evidence Of Such Authorization; And Any Other Information That Can Help Nist Determine Whether This Requirement May Be Competitively Satisfied. a Determination By The Government Not To Compete The Proposed Acquisition Based Upon Responses To This Notice Is Solely Within The Discretion Of The Government. Information Received Will Be Considered Solely For The Purpose Of Determining Whether To Conduct A Competitive Procurement. Only Responses Received By The Offers Due Date And Time Of This Notice Will Be Considered By The Government. Responses Shall Be Submitted Via Email To Nina.lin@nist.gov.