Forschungszentrum J Lich GmbH Tender Result
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AOC Description
Translated
Cryogenic measuring location for characterizing CMOS circuits and components at temperatures up to 4.2K and frequencies up to 20 GHz
Original
Kryogener Messplatz zur Charakterisierung von CMOS-Schaltungen und Bauelementen bei Temperaturen bis zu 4.2K und Frequenzen bis 20 GHz
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349975-2018Award No
349975-2018Tender Id
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Forschungszentrum J Lich GmbH ViewPurchaser Address
-Website
http://http://www.fz-juelich.de
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